压在透明的玻璃上c_又色又爽又黄又免费的视频软件_av无码专区亚洲av波多野结衣_国产在线每日都有更新 - www国产视频

阻燃防火材料-網上貿易平臺 | | WAP瀏覽
服務熱線:4006555305
當前位置: 首頁 » 防火測試中心 » 各國標準法規 » 美國 » 正文

ASTM F1893測量半導體器件電離劑量率熔蝕指南

放大字體  縮小字體 發布日期:2012-02-08   瀏覽次數:49  分享到: 分享到騰訊微博
ASTM F1893測量半導體器件電離劑量率熔蝕指南
ASTM F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM F1893測量半導體器件電離劑量率熔蝕指南

The use of FXR or LINAC radiation sources for the determination of high dose-rate burnout in semiconductor devices is addressed in this guide. The goal of this guide is to provide a systematic approach to testing semiconductor devices for burnout or survivability.
The different types of failure modes that are possible are defined and discussed in this guide. Specifically, failure can be defined by a change in device parameters, or by a catastrophic failure of the device.
This guide can be used to determine if a device survives (that is, continues to operate and function within the specified performance parameters) when irradiated to a predetermined dose-rate level; or, the guide can be used to determine the dose-rate burnout failure level (that is, the minimum dose rate at which burnout failure occurs). However, since this latter test is destructive, the minimum dose-rate burnout failure level must be determined statistically.
1. Scope
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

2. Referenced Documents (purchase separately)
ASTM Standards
E170 Terminology Relating to Radiation Measurements and Dosimetry
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
F526 Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
Index Terms
burnout; failure; high dose-rate; integrated circuits; ionizing radiation; latchup; microcircuits; semiconductor devices; survivability;

  詳情請咨詢
  防火資源網-阻燃防火測試中心
  電話:(+86)0592-5056213
  傳真:(+86)0592-5105807
  郵件:firetest@firetc.com

凡注明"防火資源網"的所有作品,由<防火資源網>整理編輯,任何組織未經<防火資源網>及其擁有者授權,不得復制、轉載、摘編或利用其它方式應用于任何商業行為。

 
 
[ 防火測試中心搜索 ]  [ ]  [ 告訴好友 ]  [ 打印本文 ]  [ 關閉窗口 ]  [ 返回頂部 ]

 

 
 
推薦防火測試
推薦圖文
點擊排行
 
 
網站首頁 | 廣告服務 | 關于我們 | 聯系方式 | 服務協議 | 版權聲明 | 網站地圖 | 友情鏈接 | 網站留言 | 舊版本 | 閩ICP備09009213號
?2019-2021 FIRETC.COM All Rights Reserved ? 備案號:閩ICP備09009213號-1在線客服 點擊QQ交談/留言 點擊QQ交談/留言